Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-07-25
2006-07-25
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257S774000
Reexamination Certificate
active
07081408
ABSTRACT:
Embodiments of a method of forming a tapered via using a receding mask are disclosed. In one embodiment, an etch mask formed on a substrate includes a first aperture in a first photoresist layer and a second, larger aperture in an overlying second photoresist layer. Peripheries of the first and second apertures may be tapered as a result of an out-of-focus exposure. An etching process may be performed to create a tapered via in the substrate, and during this etching process, the first, relatively thinner photoresist layer will recede outwardly toward the aperture in the second photoresist layer. Other embodiments are described and claimed.
REFERENCES:
patent: 5374503 (1994-12-01), Sachdev et al.
patent: 6577010 (2003-06-01), Batra et al.
Hill Charles D.
Lane Ralph L.
Ahmadi Mohsen
Intel Corporation
Lebentritt Michael
Tweet Kerry D.
LandOfFree
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