Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-06-24
2008-06-24
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07392503
ABSTRACT:
A method of correcting a mask pattern is provided. First, an original writer drawing data of a circuit layout pattern is inputted. Then, according to the original writer drawing data, a correcting writer rule is selected by searching from a look-up table. According to the correcting writer rule, the original writer drawing data is corrected to obtain a corrected writer drawing data of the circuit layout pattern.
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Chiang Jack
Jianq Chyun IP Office
Tat Binh C
Winbond Electronics Corp.
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