Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2000-01-31
2002-11-26
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S016000, C703S017000
Reexamination Certificate
active
06487699
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates to the testing of computer system designs by software simulation, and more particularly to a verification methodology for system-on-chip (SOC) designs which provides for controlling design elements external to an SOC.
The complexity and sophistication of present-day integrated circuit (IC) chips have advanced significantly over those of early chip designs. Where formerly a chip might embody relatively simple electronic logic blocks effected by interconnections between logic gates, currently chips can include combinations of complex, modularized IC designs often called “cores” which together constitute an entire “system-on-a-chip”, or SOC.
In general, IC chip development includes a design phase and a verification phase for determining whether a design works as expected. The verification phase has moved increasingly toward a software simulation approach to avoid the costs of first implementing designs in hardware to verify them.
A key factor for developers and marketers of IC chips in being competitive in business is time-to-market of new products; the shorter the time-to-market, the better the prospects for sales. Time-to-market in turn depends to a significant extent on the duration of the verification phase for new products to be released.
As chip designs have become more complex, shortcomings in existing chip verification methodologies which extend time-to-market have become evident.
Typically, in verifying a design, a simulator is used. Here, “simulator” refers to specialized software whose functions include accepting software written in a hardware description language (HDL) such as Verilog or VHDL which models a circuit design (for example, a core as described above), and using the model to simulate the response of the design to stimuli which are applied by a test case to determine whether the design functions as expected. The results are observed and used to de-bug the design
In order to achieve acceptably bug-free designs, verification software must be developed for applying a number of test cases sufficient to fully exercise the design in simulation. In the case of SOC designs, the functioning of both the individual cores as they are developed, and of the cores interconnected as a system must be verified. Moreover, a complete SOC design usually includes an embedded processor core; simulation which includes a processor core tends to require an inordinate amount of time and computing resources, largely because the processor is usually the most complex piece of circuitry on the chip and interacts with many other cores.
It can be appreciated from the foregoing that verification of an SOC can severely impact time-to-market, due to the necessity of developing and executing software for performing the numerous test cases required to fully exercise the design.
However, inefficiencies in current verification methodologies exacerbate time pressures. For example, SOC designs typically interface with cores that are external to the design. Existing methods of including such external cores in a verification test of a SOC design typically entail having to create special test cases to control the external cores; such test cases typically do not communicate with test cases being applied internally to the SOC and therefore lack realism. Calls to built-in simulator functions to control external cores are also used. However, such an approach is simulator-dependent and therefore not portable across simulators.
A verification methodology is needed which addresses the problems noted in the foregoing, which represent factors extending time-to-market.
SUMMARY OF THE INVENTION
The present invention provides a method for communicating with and controlling cores which are external to a SOC design during verification of the design, which avoids the above-noted inefficiencies in existing verification methods. According to the method, an external memory-mapped test device (EMMTD) is coupled between a SOC design being tested in simulation, and cores external to the SOC design. The EMMTD is coupled to the SOC via a chip-external bus, and coupled to external cores, or to the external interfaces of cores internal to the SOC, via an EMMTD bi-directional bus.
The EMMTD processes signals received over the chip external bus and applies them to an external core, or to an internal core with an external interface, coupled to the EMMTD bi-directional bus. Internal logic in the EMMTD provides for control and status monitoring of a core coupled to the EMMTD bi-directional bus by enabling functions including driving data on the bus, reading the current state of data on the bus, and capturing positive and negative edge transitions on the bus.
A test case being executed for SOC verification by a simulated embedded processor in the SOC can communicate with and control elements external to the SOC, by using the EMMTD to perform such functions as initiating external core logic which drives test signals to an internal core, directly controlling an internal core via its external interface, or determining the status of an external core.
The EMMTD may also be physically embodied in, for example, an FPGA (Field Programmable Gate Array) or an ASIC (Application Specific Integrated Circuit) usable with real hardware.
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Devins Robert J.
Herzl Robert D.
Milton David W.
Ogilvie Clarence R.
Connolly Bove & Lodge & Hutz LLP
International Business Machines - Corporation
Kotulak R.M.
Siek Vuthe
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