Method of controlling defect orientation in silicon crystal ribb

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156617SP, 156DIG64, 156DIG65, 156DIG88, B01J 1718, C01B 3302

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active

041219651

ABSTRACT:
The orientation of twinning and other effects in silicon crystal ribbon growth is controlled by use of a starting seed crystal having a specific {110} crystallographic plane and <112> crystallographic growth direction.

REFERENCES:
patent: B584997 (1976-03-01), Cizzek
patent: 2961305 (1960-11-01), Dash
patent: 3130040 (1964-04-01), Faust
patent: 3341361 (1967-09-01), Gorski
patent: 3591348 (1971-07-01), La Belle, Jr.
patent: 3759671 (1973-09-01), Bleil
patent: 3977934 (1976-08-01), Lesk
Dash, Growth of Silicon Crystals Free From Dislocations, J. of App. Phys., vol. 30, #4, Apr. 1959, pp. 459-474.
Barrett, "Growth of Wide, Flat Crystals of Silicon Web, J. Electro. Chem. Soc., Solid State Sci., Jun. 1971, vol. 118, #6, pp. 952-957.

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