Method of cleaning by removing particles from surfaces, a...

Cleaning and liquid contact with solids – Processes – Including use of vacuum – suction – or inert atmosphere

Reexamination Certificate

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Details

C134S001000, C134S019000, C134S006000, C134S007000, C134S025400, C134S042000, C034S282000, C034S359000, C034S361000, C034S363000, C034S364000, C034S365000, C034S397000, C034S401000, C034S402000, C034S403000, C034S406000, C034S409000

Reexamination Certificate

active

10658800

ABSTRACT:
A lithographic mask is placed in a chamber which is then sealed. The gas pressure in the chamber is reduced to dislodge contaminant particles on the mask surface.

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English Translation of Japanese Office Action issued in Japanese Patent Application No. 2003-321110 dated Jan. 20, 2006.
English Translation of Japanese Office Action issued in Japanese Patent Application No. 2003-321110 mailed May. 9, 2006.

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