Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-07-06
2008-08-26
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07418677
ABSTRACT:
A calculating apparatus includes a finite element model creating unit that creates a finite element model of the wire structure, a setting unit that sets physical properties, restriction conditions and loads of the wire structure to the finite element model, a predictive shape calculating unit that calculates a predictive shape of the finite element model in a physically balanced condition, an outputting unit that outputs the predictive shape of the finite element model, a load calculating unit that calculates the loads which are applied to the respective joints of the finite element model, a displacing unit that displaces a predetermined control point on the finite element model. The predictive shape calculating unit calculates the predictive shape of the finite element model in which the control point is displaced, based on the loads applied to the finite element model prior to the displacement of the control point.
REFERENCES:
patent: 7124069 (2006-10-01), Meuris et al.
patent: 7133810 (2006-11-01), Butler et al.
patent: 7206723 (2007-04-01), Sawai et al.
patent: 2005/0203663 (2005-09-01), Sawai
patent: 1 130 527 (2001-09-01), None
patent: 1 403 146 (2004-03-01), None
patent: 1 426 886 (2004-06-01), None
patent: 2001-250438 (2001-09-01), None
patent: 2002-231074 (2002-08-01), None
patent: 2002-373533 (2002-12-01), None
patent: 2003-22720 (2003-01-01), None
patent: 2003-22721 (2003-01-01), None
patent: 2003-141197 (2003-05-01), None
patent: 2003-141949 (2003-05-01), None
patent: 2003-151383 (2003-05-01), None
patent: 2004-139974 (2004-05-01), None
Hillerin De C-A: “Use of the Fem for the Design of Flexible Parts”, Proceedings of Nafems World Congress, XX, XX, vol. 1, Apr. 25, 1999, pp. 345-356, XP009052130.
Inoue Yoshihiro
Sawai Masayoshi
Chiang Jack
Sughrue & Mion, PLLC
Tat Binh
Yazaki -Corporation
LandOfFree
Method of calculating predictive shape of wire structure,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of calculating predictive shape of wire structure,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of calculating predictive shape of wire structure,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3993070