Method of blind border pattern layout for attenuated phase shift

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

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430 22, G03F 900

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active

060015128

ABSTRACT:
A mask and method of systematically laying out the mask for test patterns in the frame cell region of an attenuating phase shifting mask are described. An array of sub-resolution contact holes are used in the border regions of the mask to prevent over exposure of photoresist in the regions between the device regions on a wafer due to side lobe effect. The mask and method provide for a buffer distance surrounding the features of the test patterns. The buffer distance is free of sub-resolution contact holes. When the buffer distance is correctly chosen problems due to side lobe effect at the frame cell portion of the mask are prevented.

REFERENCES:
patent: 5446521 (1995-08-01), Hainsey et al.
patent: 5537648 (1996-07-01), Liebmann et al.
patent: 5565286 (1996-10-01), Lin
patent: 5620816 (1997-04-01), Dao
patent: 5644381 (1997-07-01), Miyazaki et al.
"ULSI Technology" by CM Chang and SM. Sze, McGraw-Hill Companies, 1996, pp. 284-289

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