Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-05-27
2008-05-27
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C703S019000
Reexamination Certificate
active
07380228
ABSTRACT:
A method and computer program product for associating timing violations with critical structures in an integrated circuit design include steps of: (a) receiving as input an integrated circuit design; (b) identifying a critical structure in the integrated circuit design; and (c) generating as output a script for a static timing analysis tool that includes a timing check for a path having a start point at an input of the critical structure and an end point at an output of the critical structure.
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Fry Randall P.
Lahner Juergen
Pierce Gregory
LSI Corporation
Rossoshek Helen
Whitesell Eric James
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