Method of applying boundary test patterns

Details Method of applying boundary test patterns Method of applying boundary test patterns

1995-02-14

1997-02-25

Canney, Vincent P.

Excavating

H04B 1700

Patent

active

056065655

ABSTRACT:
A boundary scan cell including a three-state output buffer, a test data scan flip-flop for providing an input to the three-state buffer, a control data scan flip-flop for receiving a serial control data input, independent clock signals for independently clocking the test data scan flip-flop and the control data scan flip-flop, and control circuitry for controllably providing the output of the control data scan flip-flop to the three-state output driver such that the enabled state of the three-state output buffer is controlled by the output of the control data scan flip-flop, whereby the enabled state of the three-state output driver is controlled independently of the test data in the test data scan flip-flop.

REFERENCES:
patent: 5270642 (1993-12-01), Parker
patent: 5513188 (1996-04-01), Parker et al.

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