Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-02-14
2006-02-14
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07000215
ABSTRACT:
A method of designing patterns has preparing a mask pattern used in a lithography process for transferring a circuit pattern intersecting with a step pattern on a substrate which has the step pattern designed thereon, and applying correction patterns to the mask pattern in accordance with correction rules considering a shape of the step pattern, the correction patterns being applied at intersections of edges of the circuit pattern and the step pattern and in the vicinity of the intersections.
REFERENCES:
patent: 3998639 (1976-12-01), Feldman et al.
patent: 6268234 (2001-07-01), Yoshida
patent: 6509251 (2003-01-01), Saito et al.
patent: 6536015 (2003-03-01), Ono
patent: 6664010 (2003-12-01), Ahrens et al.
patent: 6721938 (2004-04-01), Pierrat et al.
patent: 6815148 (2004-11-01), Matsumoto
patent: 2003/0126582 (2003-07-01), Kobayashi et al.
patent: 2003/0163791 (2003-08-01), Falbo et al.
patent: 2001-133956 (2001-05-01), None
Hashimoto Koji
Kobayashi Yuji
Nakano Ayako
Sato Takashi
Shibata Tsuyoshi
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Siek Vuthe
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