Wave transmission lines and networks – Automatically controlled systems – Impedance matching
Patent
1998-01-09
1999-07-27
Gensler, Paul
Wave transmission lines and networks
Automatically controlled systems
Impedance matching
31511121, 364482, H03H 740
Patent
active
059297174
ABSTRACT:
Variable reactances of a matching network connected between an r.f. source and a plasma load of a vacuum plasma chamber processing a workpiece are varied so a tendency of the plasma to change in an unstable manner which can adversely affect processing of the workpiece is avoided while matching is approached. The plasma tendency to change in an unstable manner is detected by monitoring an electrical parameter resulting from r.f. current flowing between the source and load via the network. The parameter can be (1) statistically based, e.g. variance of percent delivered power, or (2) amplitude modulation in one or both of the 2-20 kHz and 50-200 kHz ranges.
REFERENCES:
patent: 5689215 (1997-11-01), Richardson et al.
patent: 5793162 (1998-08-01), Barnes et al.
patent: 5815047 (1998-09-01), Sorensen et al.
patent: 5842154 (1998-11-01), Harnett
Ngo Tuan
Richardson Brett C.
Gensler Paul
Lam Research Corporation
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