Method of and apparatus for inspection of external appearance of

Details Method of and apparatus for inspection of external appearance of Method of and apparatus for inspection of external appearance of

1992-08-17

1995-08-08

Moore, David K.

Image analysis

Applications

Manufacturing or product inspection

G06K 962

Patent

active

054406498

ABSTRACT:
An apparatus for visual inspection detects defects on an object to be inspected, stores the defects, calculates the distance between two detected defects from the positions of the two detected defects, and judges the two detected defects to be different portions of a single actual defect when the distance between the two defects is less than a predetermined threshold value. The apparatus also stores the actual defects, as well as class-of-actual-defect inference rules necessary for inferring the class of the actual defects from the class of each detected defect. The class of the actual defect is judged from the class of each detected defect on the basis of the class-of-actual-defect inference rules, and the class of the actual defect is then stored. A method of visual inspection and a method of removing the cause of an abnormality are also disclosed.

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patent: 4910411 (1990-03-01), Teraguchi et al.
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