Method for VLSI system debug and timing analysis

Details Method for VLSI system debug and timing analysis Method for VLSI system debug and timing analysis

2006-09-26

2006-09-26

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07114136

ABSTRACT:
A method for characterizing circuit activity in an IC. Generally, the method comprises the steps of activating an IC, resolving the switching activity in space and time, and generating a representation of the switching behavior which differentiates the time that circuits or transistors switch. One embodiment of the invention, utilizes a method such as, but not limited to, time resolved photon emission to observe transistor level switching activity in an integrated circuit (IC).

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Howard, R.E. et al., “Single Electron Switching Events in Nanometer-Scale Si MOSFET's”, IEEE Transactions on Electron Devices, vol. ED-32, No. 9, Sep. 1985, pp. 1669-1674.

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