Optics: measuring and testing – Surface roughness
Reexamination Certificate
2007-08-14
2007-08-14
Phan, James (Department: 2872)
Optics: measuring and testing
Surface roughness
C359S226200, C359S900000, C356S608000
Reexamination Certificate
active
11308319
ABSTRACT:
A method for verifying scan precision of a laser measurement machine includes the steps of: preparing a transparent flat, of which the flatness of each plane is regarded as a flatness conventional true value; determining an optimum scanning mode; determining optimum scanning parameters under the optimum scanning mode; scanning the transparent flat under the optimum scanning mode and the optimum scanning parameters for certain times, and obtaining measuring data; calculating a plurality of flatness values using the measuring data; calculating an average value and a standard deviation of the flatness values, and a bias between the average value and the flatness conventional true value; evaluating the repetitiveness of the laser measurement machine according to the standard deviation; and evaluating the veracity of the laser measurement machine according to the bias.
REFERENCES:
patent: 3866038 (1975-02-01), Korth
patent: 6323952 (2001-11-01), Yomoto et al.
patent: 2001/0024309 (2001-09-01), Shim
Lin Kuei-Yang
Que Ling-Hua
Xin Xiao-Bo
Xu Wei
Yuan Zhong-Kui
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry (Shen Zhen) Co., Ltd.
Hsu Winston
Phan James
LandOfFree
Method for verifying scan precision of a laser measurement... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for verifying scan precision of a laser measurement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for verifying scan precision of a laser measurement... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3899518