Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-28
2006-03-28
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07020856
ABSTRACT:
Methodology for verifying properties of a circuit model in context of given environmental constraints is disclosed. Verification of a specified property is performed by analyzing only a portion of the circuit model. The present methodology is also directed towards reducing the computation time for verifying the specified property. Further, the present methodology allows the connection of an additional circuit model to the circuit model in a non-intrusive manner. The connection is made without making any modifications to the description of the circuit model. This permits the straightforward specification of related environmental constraints and properties, which makes it possible to verify correct behavior of complex interfaces.
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Higgins Joseph E.
Singhal Vigyan
Fenwick & West LLP
Jasper Design Automation, Inc.
Siek Vuthe
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