Method for validating and monitoring automatic test...

Details Method for validating and monitoring automatic test... Method for validating and monitoring automatic test...

2007-09-11

2007-09-11

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

11384793

ABSTRACT:
A method and apparatus is provided for characterizing a contactor for automated semiconductor device testing, the method first comprising placing the contactor on a contactor test board positioned within an automated test apparatus. A first probe of the automated test apparatus is contacted to a conductive layer of the contactor test board, and a second probe is placed on a contactor pin of the contactor, wherein the contactor pin is operable to linearly translate within the contactor. A predetermined pressure is applied to the contactor pin via the second probe, wherein the contactor pin is translated toward the contactor test board. An electrical characteristic of the contactor pin is measured between the first probe and the second probe and compared to a desired electrical characteristic, wherein a condition of the contactor pin is determined, based on the comparison of the measured electrical characteristic and the desired electrical characteristic.

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patent: 7135876 (2006-11-01), Petersen et al.

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