Method for using fuse identification codes for masking bad bits

Details Method for using fuse identification codes for masking bad bits Method for using fuse identification codes for masking bad bits

1996-09-20

1999-12-28

Beausoliel, Jr., Robert W.

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

G06F 1100

Patent

active

060095369

ABSTRACT:
A new method for masking off failing memory locations on a Single In-line Memory Module (SIMM) involves reading out identification (ID) codes fused in individual DRAMs. The ID codes are used to index stored fail maps taken from the DRAMs prior to their assembly onto a SIMM. After all failing locations of all of the DRAMs located on a single SIMM are determined, the SIMM is then programmed to re-route these locations to auxiliary memory located on the SIMM.

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