Method for TMAH etching of CMOS integrated circuits

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S745000, C438S753000

Reexamination Certificate

active

07094696

ABSTRACT:
A method for preparing and using a tetramethylammonium hydroxide etchant (180). The etchant is prepared by combining precisely known quantities of the etchant components obtained from liquid sources of tetramethylammonium hydroxide (110) and dissolved silicate (115). A precise quantity of an acidic (relative to tetramethylammonium hydroxide) oxidizer is added at intervals during a long etch as well as just before immersing a sample holder (135) and sample in the etchant (180). A precise quantity of tetramethylammonium hydroxide such as can obtained from a pipette (175) is also added during long etches to compensate for the reduction in etchant pH caused by the addition of the oxidizer.

REFERENCES:
patent: 5607718 (1997-03-01), Sasaki et al.
patent: 5817610 (1998-10-01), Honda et al.
patent: 6261466 (2001-07-01), Bayes et al.
patent: 6315635 (2001-11-01), Lin
patent: 6338743 (2002-01-01), Dusemund et al.
patent: 6372055 (2002-04-01), Montano et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for TMAH etching of CMOS integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for TMAH etching of CMOS integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for TMAH etching of CMOS integrated circuits will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3668979

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.