Method for thermally treating a substrate that comprises...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal

Reexamination Certificate

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C438S048000, C438S767000, C438S508000, C438S508000, C372S096000, C257S098000

Reexamination Certificate

active

07144747

ABSTRACT:
A method of thermally treating a substrate that has multiple layers is provided. A substrate layer that is covered on opposite sides is oxidized from side edges thereof toward a center thereof such that, via the following steps, a defined central portion is not oxidized. The substrate is heated in a process chamber to a prescribed treatment temperature. A hydrogen-rich water vapor is introduced into the process chamber for a specified period of time, wherein such introduction is effected prior to, during and/or after the step of heating the substrate to the prescribed temperature. After conclusion of the specified period of time, introduced into the process chamber is one of the group consisting of: dry oxygen, namely pure oxygen in the form of at least one of atomic O, molecular O2and O3; a mixture of oxygen and an inert gas that does not chemically react with the layers of the substrate; an oxygen-containing compound that contains no water; and an oxygen-rich water vapor.

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Article, “Lateral oxidation of AIAs layers at elevated water vapour pressure using a closed-chamber system”.
Article High Reliable, Low Threshold 1.3 μm SL-QW PACIS Laser Array.
Article, “Single Mode A1GaAs-GaAs Lasers Using Lateral Confinement by Native-Oxide Layers”.

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