Thermal measuring and testing – Determination of inherent thermal property
Patent
1991-08-02
1992-11-24
Cuchlinski, Jr., William A.
Thermal measuring and testing
Determination of inherent thermal property
374 44, 374137, G01N 2520, G01N 2704, G01N 2718
Patent
active
051657945
ABSTRACT:
A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.
REFERENCES:
patent: 2484736 (1949-10-01), Razek
patent: 3263485 (1966-08-01), Mahmoodi
patent: 3721897 (1973-03-01), Edling
patent: 4176554 (1979-12-01), Kazmierowicz
patent: 4242907 (1981-01-01), Kazmierowicz
patent: 4324138 (1982-04-01), Davis et al.
patent: 4450509 (1984-04-01), Agarwal
patent: 4730160 (1988-03-01), Cusack et al.
patent: 4737917 (1988-04-01), Perron
patent: 4916715 (1990-04-01), Adiutori
patent: 4933887 (1990-06-01), Danko et al.
Albrecht John M.
Cordell Helen S.
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
Moser William R.
LandOfFree
Method for the thermal characterization, visualization, and inte does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for the thermal characterization, visualization, and inte, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the thermal characterization, visualization, and inte will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-919136