Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-07-22
2008-07-22
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07404153
ABSTRACT:
In order to improve the functionality of a computer-assisted design, test and/or development environment for a data processing circuit arrangement, the instructions of the circuit arrangement are stored in a machine-readable manner in a data base with the binary representations thereof. The allocation of a predefined binary representation (instruction code) to an instruction occurs in a modifiable manner. In this way, processors can be developed which are specialized and optimized in terms of processing specific software applications. The invention also relates to a computer-assisted design, test and/or circuit environment corresponding the above-mentioned method.
REFERENCES:
patent: 5619665 (1997-04-01), Emma
patent: 5761740 (1998-06-01), Johnson et al.
patent: 6658458 (2003-12-01), Gai et al.
patent: 7065633 (2006-06-01), Yates et al.
patent: 2003/0009453 (2003-01-01), Basso et al.
patent: 2003/0140337 (2003-07-01), Aubury
patent: 2003/0225998 (2003-12-01), Khan et al.
patent: 2004/0111595 (2004-06-01), Klein
patent: 2004/0268348 (2004-12-01), Waki et al.
patent: 2005/0086451 (2005-04-01), Yates et al.
patent: 2005/0175005 (2005-08-01), Brown
patent: 2006/0031661 (2006-02-01), Takayama et al.
patent: 2006/0101369 (2006-05-01), Wang et al.
Schwann Paul
Weiss Matthias
Baker & Botts L.L.P.
Chiang Jack
Parihar Suchin
Phillips Semiconductors Dresden AG
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