Method for the integration of two bipolar transistors in a...

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Having multiple emitter or collector structure

Reexamination Certificate

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C438S343000, C257S563000, C257S564000

Reexamination Certificate

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07605047

ABSTRACT:
A method for the integration of two bipolar transistors in a semiconductor body, wherein, for the first bipolar transistor, a first emitter semiconductor region, a first base semiconductor region, and a first collector semiconductor region are produced. A recombination layer is applied to the first bipolar transistor, which is adjacent to the first emitter semiconductor region or the first collector semiconductor region and is constructed in such a way that charge carriers recombine on the recombination layer, and next, the second bipolar transistor is placed on the recombination layer, wherein a second emitter semiconductor region, a second base semiconductor region, and a second collector semiconductor region are produced on the recombination layer, so that the second emitter semiconductor region or the second collector semiconductor region is adjacent to the recombination layer.

REFERENCES:
patent: 4651410 (1987-03-01), Feygenson
patent: 4717681 (1988-01-01), Curran
patent: 4771013 (1988-09-01), Curran
patent: 4837177 (1989-06-01), Lesk et al.
patent: 5037774 (1991-08-01), Yamawaki et al.
patent: 5376821 (1994-12-01), Puzzolo et al.
patent: 3743776 (1989-07-01), None
patent: 0 493 854 (1992-07-01), None
patent: 0 605 920 (1994-07-01), None
U. Tietze, CH. Schenk: “Semiconductor Circuit Technology”, Springer-Verlag, Berlin, pp. 112-113.

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