Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-24
2009-08-04
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S001000, C703S002000, C703S016000, C703S017000, C703S019000
Reexamination Certificate
active
07571398
ABSTRACT:
A method is specified for determining the quality of a quantity of properties describing a machine, including a step for determining the existence of at least one sub-quantity of interrelated properties (P0, P1, . . . Pn) of the form Pi=(forall t. Ai(t)=>Zi(t)), wherein Ai(t) present an initial state and Zi(t) a target state for a corresponding property and at least one initial state Aiis dependant on internal signals and including a step for checking whether at least one aspect of the input/output behaviour of the machine described by the properties, which cannot be derived from an individual property Pi, is described to such an accurate extent that one property Q exists, which represents this aspect without being dependant on the internal signals. The procedure is capable of providing a measurement and can particularly be used in the verification and specification of circuits.
REFERENCES:
patent: 5065335 (1991-11-01), Yokota et al.
patent: 5689685 (1997-11-01), Feldmann et al.
patent: 5880966 (1999-03-01), Hogan
patent: 6131078 (2000-10-01), Plaisted
patent: 6324678 (2001-11-01), Dangelo et al.
patent: 6530065 (2003-03-01), McDonald et al.
patent: 6594804 (2003-07-01), Hojati
patent: 6728939 (2004-04-01), Johannsen
patent: 6848088 (2005-01-01), Levitt et al.
patent: 7020856 (2006-03-01), Singhal et al.
patent: 7124383 (2006-10-01), Chen et al.
patent: 7159198 (2007-01-01), Ip et al.
patent: 2005/0010882 (2005-01-01), Winkelmann et al.
patent: 2005/0114809 (2005-05-01), Lu
patent: 2005/0159835 (2005-07-01), Yamada et al.
patent: 2005/0183048 (2005-08-01), Kinzelbach
patent: 2006/0156261 (2006-07-01), Farkash et al.
patent: 2006/0161413 (2006-07-01), Wei et al.
patent: 2006/0212837 (2006-09-01), Prasad
patent: 2006/0225022 (2006-10-01), Ezaki
patent: 2001005847 (2001-01-01), None
G. Feierbach and V. Gupta, “True Coverage: A Goal of Verification”, Proceedings of the Fourth International Symposium on Quality Electronic Design (ISQED'03)., Mar. 24-26, 2003, pp. 75-78.
Frenkel, S., “Verification Model Structures for Digital Systems Design”, source(s): mtu-net.ru.
Um, et al., “A Systematic Transaction-Level Modeling and Modeling and Verification”, source(s): samsung.com (2006).
Regimbal, et al., “Automating Functional Coverage Analysis Based on an Executable Specification”, 3rd IEEE Int'l Workshop on System-on-Chip for Real-Time Appl. (2003).
Ghosh, et al., “A Technique for Estimating the Difficulty of a Formal Verification Problem”, Proc. of the 7th International Symposium on Quality Electronic Design Mar. 27-29, 2006.
Zhang, et al., “A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage”, IEEE Trans. on Computer-Aided Design (2006), vol. 25, No. 11, Nov. 2006, pp. 2526-2538.
Byeong Min and Gwan Choi, “RTL Functional Verification Using Excitation and Observation Coverage”, source(s): tamu.edu.
Grosse D. et al., “Acceleration of SAT-based iterative property checking”, (2005).
Nimmer, J.W., “Static verification of 1-19 dynamically detected program invariants—Integrating Diakon and ESC/Java,” Electronic Notes in Theoretical Computer Science, Elsevier, Bd. 55, Nr. 2, Oct. 2001.
Katz, et al., “Have I written enough Properties?”, a Method of Comparison Between Specification and Implementation CHARME 99, LCNS 1703 (1999).
Drechsler et al., “Design Understanding by Automatic Property Generation” (2006).
Bormann Jörg
Busch Holger
24IP Law Group
DeWitt Timothy R.
Kik Phallaka
LandOfFree
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