Method for testing pixels for LCD TFT displays

Details Method for testing pixels for LCD TFT displays Method for testing pixels for LCD TFT displays

2007-08-14

2007-08-14

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S754120

Reexamination Certificate

active

10977510

ABSTRACT:
The present invention provides a method of electron beam testing of liquid crystal displays comprising non-uniform electrodes having a conductive portion and a dielectric portion. In accordance with methods of the present invention, the diameter of the electron beam is increased so that the beam is less focused, i.e., enlarged or “blurred,” over a non-uniform electrode area. The diameter of the beam is increased so that the beam generates secondary electrons from the conductive portion of the non-uniform electrode area. The configured test beam may be circular, elliptical, or other suitable shapes.

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Brunner—TFT Array Testing: Replacing Mechanics by Electron Beam Deflection, vol. 6, Apr. 2001, pp. 15-17.

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