Method for testing micro SD devices using test circuits

Details Method for testing micro SD devices using test circuits Method for testing micro SD devices using test circuits

2007-04-12

2009-02-10

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

07489156

ABSTRACT:
A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.

REFERENCES:
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patent: 6476629 (2002-11-01), Bjork
patent: 6774662 (2004-08-01), Co et al.
patent: 2007/0210811 (2007-09-01), Cojocneanu et al.

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