Method for testing memory units to be tested and test device

Details Method for testing memory units to be tested and test device Method for testing memory units to be tested and test device

2006-03-28

2006-03-28

Beausoliel, Robert (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S054000, C714S030000, C714S718000, C714S719000

Reexamination Certificate

active

07020806

ABSTRACT:
The invention provides a method for testing a memory unit (113) to be tested in a test device (100), the memory unit (113) to be tested being introduced into the test device (100), a first data register (102a–102N) to be tested being read out from the memory unit (113) to be tested and being tested in a comparator unit (106), and then at least one further data register (102a–102N) to be tested being read out of the memory unit (113) to be tested and tested in a comparator unit (106).

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