Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate
2006-07-18
2006-07-18
Tu, Christine T. (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Skew detection correction
72
Reexamination Certificate
active
07080292
ABSTRACT:
A method and apparatus is presented for measuring jitter tolerance in a device under test. A device under test is established to operate at a specific frequency. A bit pattern is generated from a bit pattern generator. The bit pattern generated by the bit pattern generator is produced at a frequency that is a multiple of the frequency that the device under test is operating under. Bits are systematically changed in the bit pattern and then errors are measured in the device under test. As a results the jitter tolerance of the device under test is measured.
REFERENCES:
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patent: 6374388 (2002-04-01), Hinch
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Moore Charles E.
Nguyen Jason T.
Vandivier Suzette D.
Volz Aaron M.
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