Method for testing jitter tolerance of high speed receivers

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

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Reexamination Certificate

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07080292

ABSTRACT:
A method and apparatus is presented for measuring jitter tolerance in a device under test. A device under test is established to operate at a specific frequency. A bit pattern is generated from a bit pattern generator. The bit pattern generated by the bit pattern generator is produced at a frequency that is a multiple of the frequency that the device under test is operating under. Bits are systematically changed in the bit pattern and then errors are measured in the device under test. As a results the jitter tolerance of the device under test is measured.

REFERENCES:
patent: 5463639 (1995-10-01), Koishi et al.
patent: 5835501 (1998-11-01), Dalmia et al.
patent: 6374388 (2002-04-01), Hinch
patent: 2003/0041294 (2003-02-01), Moll et al.

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