Method for testing internal high voltage in nonvolatile...

Details Method for testing internal high voltage in nonvolatile... Method for testing internal high voltage in nonvolatile...

2007-12-17

2010-06-01

Phan, Trong (Department: 2827)

Static information storage and retrieval

Floating gate

Particular biasing

C365S185030, C365S185190, C365S185290, C365S185330, C365S226000, C365S233100

Reexamination Certificate

active

07729173

ABSTRACT:
In a voltage output circuit of a nonvolatile semiconductor memory device, a high voltage generator generates an internal high voltage, a sampling signal generator generates a sampling signal, and a sample and old circuit samples and holds the internal high voltage in accordance with the sampling signal.

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patent: 2004/0032353 (2004-02-01), Kattan
patent: 2005/0024330 (2005-02-01), Astrauskas

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