Electrical computers and digital data processing systems: input/ – Intrasystem connection – Bus access regulation
Reexamination Certificate
1998-08-04
2001-08-28
Hjerpe, Richard (Department: 2674)
Electrical computers and digital data processing systems: input/
Intrasystem connection
Bus access regulation
C710S010000, C710S120000, C713S002000
Reexamination Certificate
active
06282595
ABSTRACT:
FIELD OF THE INVENTION
The present invention is related to a method for testing an interface card, and more particularly to a method for testing a peripheral interface card used with a computer.
BACKGROUND OF THE INVENTION
Computer is commonly known at the modern age. It is impossible to overestimate the importance of computers. The popularization of computers in a country often expresses the technological development of this country. Peripheral devices of a computer such as monitor and speaker are essential parts of the computer to perform multimedia effect. Accordingly, there is a great demand for interface cards, e.g. display card or sound blaster card to communicate the computer with its peripheral devices. It is a burning question for the manufacturers of interface cards how to increase testing speed and decrease testing cost.
For instance, please refer to
FIG. 1
showing how to test a 3D display card. For testing the 3D display card
13
, the testing system includes a computer
11
and a monitor
12
. At first, the tester inserts the 3D display card
13
onto a slot of the main board
111
of the computer
11
. The main board
111
will execute a basic input/output system (BIOS) program after starting the computer
11
. The basic input/output system program is used for self-testing and detecting the peripheral devices electrically connected to the computer. After the computer passes the self-test predetermined by the basic input/output system program, the boot program and operating system (Dos or Windows 95) stored in the hard disk
112
are loaded in the memory of the computer
11
. Then, the tester inputs an instruction for the computer to execute a test program stored in the hard disk
112
to test the 3D display card
13
. The tester may watch out for the testing result from the monitor
12
. The tester must turn off the computer if he wants to test another 3D display card. After a 3D display card
13
is completely tested, the tester will withdraw the tested 3D display card
13
from the slot of the main board
111
and insert another 3D display card to be tested onto the slot of the computer
11
. Then, another testing procedure including starting the computer, executing the basic input/output system program, loading the operating system, and executing the testing program is repeated to test the second 3D display card.
The conventional testing procedure for testing a 3D display card is shown in FIG.
2
. It includes the following steps:
step (1): adjusting the clock of video memory of the 3D display card
13
as indicated in block
21
. This step is used to decrease the noises which will seriously affect the testing result.
step (2): testing the video memory of the 3D display card as indicated in block
22
.
step (3): testing the 2D engine of the 3D display card as indicated in block
23
.
step (4): testing the 3D engine of the 3D display card as indicated in block
24
.
step (5): restoring the original clock for the video memory as indicated in block
25
.
step (6): testing the register group of the 3D display card as indicated in block
26
. This step is used to check the register index.
step (7): testing the display mode of the 3D display card as indicated in block
27
. Different refresh rates are used in response to different display modes to test the display states.
Step (8): showing the testing report as indicated in block
28
.
However, the aforementioned testing method using the testing program stored in the hard disk is not practicable. Each testing cycle, including steps of switching on the computer, loading the operating system such as Windows 95, and completely testing the 3D display card, spends much time. The total spent time approximates 90 seconds. The testing period is so long to seriously affect the productivity. Another drawback of the conventional testing method is the damage of the hard disk caused by frequent switch. The switch between on-state and off-state with considerable frequency will result in a reduced lifetime of the hard disk. The average market cost of a hard disk is about NT$ 4,000. A hard disk can only perform 5,000 to 10,000 testing cycles. Hence, the production cost of 3D display cards can not be lowered.
Another testing system for testing a 3D display card is developed to solve the aforementioned problem. Please refer to
FIG. 3
which shows another conventional testing system for testing a 3D display card. The hard disk is replaced by a read-only memory (ROM) card
312
. The testing system includes a computer
31
and a monitor
32
. The testing method is similar to the aforementioned one. The tester inserts the 3D display card
33
onto a slot of the main board
311
of the computer
31
. The main board
311
executes the basic input/output system program after starting the computer
31
. When the 3D display card
33
is detected, the testing program recorded in the read-only memory card
312
gains the master control over other programs. The testing program is executed to test the 3D display card
33
. The testing result is also shown on the monitor
32
. Then, the entire testing method is repeated to test other 3D display cards.
Such testing method can speed up the testing procedure because testing the 3D display card need not load the operating system. The average cost of a read-only memory card is about NT$ 100. The card employs an electrically erasable programmable read-only memory (EEPROM) which is rewritable and serviceable. Therefore, the production cost including testing cost is lowered. However, the capacity of the read-only memory card is much less than that of the hard disk. Some big testing programs can not be stored in the read-only memory card. For example, a 3D pattern used for testing the 3D engine is too big to be stored in the read-only memory card. Hence, the testing procedure can not be completed by just using the read-only memory card. It will affect the yield of the 3D display cards.
SUMMARY OF THE INVENTION
An objective of the present invention is to provide a cost-effective method for testing an interface card.
Another objective of the present invention is to provide a fast method for completely testing an interface card.
Another further objective of the present invention is to provide a method for testing an interface card without lowering the yield.
In accordance with the present invention, a method for testing an interface card used with a computer includes steps of (a) providing the computer with a read-only memorizing device for saving a testing program therein, (b) starting the computer, (c) detecting whether there exists the interface card electrically connected to the computer, (d) causing the computer to change from a first mode to a second mode when the interface card is detected, and (e) executing the testing program to test the interface card.
In accordance with another aspect of the present invention, the read-only memorizing device is preferably a read-only memory card including electrically erasable programmable read-only memories.
In accordance with another aspect of the present invention, the detecting step (c) is preferably executed by running a basic input/output system program. The basic input/output system program can self-test and detect other peripheral devices electrically connected to the computer.
In accordance with another aspect of the present invention, the step (d) preferably includes steps of (d1) detecting a version of the basic input/output system program, (d2) saving an initial address of an interrupt vector of the computer, (d3) assigning a specific address to the interrupt vector of the computer in response to the version of the basic input/output system program, (d4) restoring the initial address for the interrupt vector of the computer, and (d5) loading the testing program into a conventional memory of the computer. The interrupt vector mentioned in steps (d2), (d3), and (d4) is 10h when the basic input/output system is manufactured by AMI. Alternatively, the interrupt vector should be 09h when the basic input/output system is manufactured by Award.
In accordan
Lin Wen-Cheng
Pan Cheng-Feng
Greer Burns & Crain Ltd
Hjerpe Richard
Monestime Mackly
Silicon Integrated Systems Corp.
LandOfFree
Method for testing interface card does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for testing interface card, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing interface card will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2501308