Method for testing circuit units to be tested and test...

Details Method for testing circuit units to be tested and test... Method for testing circuit units to be tested and test...

2006-05-02

2006-05-02

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S512000, C709S217000

Reexamination Certificate

active

07039544

ABSTRACT:
The invention provides a test apparatus for testing circuit units (101a–101k) to be tested by means of a test system (100), having a connection device (102), tester channels (103a–103m) for connecting the test system (100) to the connection device (102) and receptacle units (104a–104k), having a number (n1, n2, . . . , nk) of circuit unit data channels dependent on the circuit units (101–101k) to be tested, provision being made of a changeover device (200) for changing over the tester channels (103a–103m) to the receptacle units (104a–104k), and it being possible to divide a number (m) of tester channels (103a–103m) between the number (n1, n2, . . . , nk) of circuit unit data channels in a predeterminable manner.

REFERENCES:
patent: 6028439 (2000-02-01), Arkin et al.
patent: 6446228 (2002-09-01), Kobayashi
patent: 42 32 735 (1993-04-01), None
patent: DE 199 37 820 (2000-03-01), None

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