Method for testing an integrated circuit including hardware...

Details Method for testing an integrated circuit including hardware... Method for testing an integrated circuit including hardware...

2005-09-13

2005-09-13

Vu, Kim (Department: 2135)

Electrical computers and digital processing systems: support

Multiple computer communication using cryptography

Protection at a particular protocol layer

C713S168000, C713S193000, C713S183000, C713S184000, C380S278000, C380S281000

Reexamination Certificate

active

06944778

ABSTRACT:
This method uses a tester (T) capable of being connected to an integrated circuit (CI) to be tested.A random number (RNG-C) is generated and ciphered using a key (k) by a cipher algorithm to obtain a password (Gk(RNG)-C). The random number (RNG-C) is sent to the tester (T) in which the received random number (RNG-C) is ciphered using the same key (k) by a same cipher algorithm to generate therein a second password (Gk(RNG)-T). This latter is sent to the integrated circuit (CI) to be compared to the first password (Gk(RNG)-C). The test of the confidential parts (1) of the circuit is only authorised if the two passwords exhibit the required match.

REFERENCES:
patent: 4802217 (1989-01-01), Michener
patent: 5526311 (1996-06-01), Kreifels et al.
patent: 5530749 (1996-06-01), Easter et al.
patent: 5629513 (1997-05-01), Geronimi et al.
patent: 5875248 (1999-02-01), Lewis
patent: 6067621 (2000-05-01), Yu et al.
patent: 6112187 (2000-08-01), Fukawa
patent: 6577229 (2003-06-01), Bonneau et al.
patent: 98/08846 (1998-07-01), None

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