Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Patent
1997-08-07
2000-05-30
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
702 84, G01R 3101
Patent
active
060701307
ABSTRACT:
A method of testing a large number of products in which every product to be tested is subjected to at least one test mode that is carried out in a test sequence successively on all products by means of a test operation comprising several successively performed measurement operations, where statistical information on the test operation of products already tested is allowed for and where a test result is allocated for every product tested. In every test mode the order of the measurement operations of a test operation is specified such that the measurement operations are arranged in accordance with their fault frequency per measurement time and the functional dependencies between the measurement operations. Every test operation within the test sequence of a test mode is allocated a measurement mode which has a certain quantity of measurement operations to be performed and which is specified in accordance with the quantity and the products already tested in a test sequence.
REFERENCES:
patent: 4875002 (1989-10-01), Sakamoto et al.
patent: 5539752 (1996-07-01), Berezin et al.
patent: 5793650 (1998-08-01), Mirza
Robert J. Feugate: "Introduction to VLSI Testing"; Prentice Hall, 1988, pp. 14-97.
Linda Milor et al.: "Minimizing Production Test Time to Detect Faults in Analog Circuits". In: IEEE Transactions, vol. 13, No. 6, Jun. 1994, pp. 796-813.
"CAQ-Systeme" by A. Schloske. Microtecnik Nr. 1,1, of Jan. 1993, pp. 26-29.
"Die Best Teststrategie Heraufinden Programm Auf PC-Basis Verhilft Zur Optimierung" by K. Jeschke et al. Bd.42,Nr. 23, 16. Nov. 1993, pp. 52-55.
"Dynamisierte Wareneingangspruefung Elektronischer Komponenten" by I. Heisecke. Bd.111,Nr.14,1.Jul. 1990 pp. 730,732, 733-735.
"On Optimising VLSI Testing or Product Quality Using Die-Yield Prediction" by A.D.Singh et al. IEEE Transacctions, Bd12, Nr.5,1. May 1993, pp.695-709.
"Messtechnik und Ruckverfolgbarkeit in der Qualitatssicherung" by N.M.Durakbasa. Electrotechnik und Informationstechnik, Bd.111, Nr.4,1.Jan. 1994,pp 185-6.
Gutmann Ralf
Jager Rolf
Hoff Marc S.
Kunitz Norman
Miller Craig Steven
Spencer George
TEMIC Telefunken microelectronic GmbH
LandOfFree
Method for testing a large quantity of products does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for testing a large quantity of products, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing a large quantity of products will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1918126