Method for testing a device and a test configuration...

Details Method for testing a device and a test configuration... Method for testing a device and a test configuration...

2005-05-17

2005-05-17

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

06895538

ABSTRACT:
A test configuration that includes a device and a method for testing the device in which test results determined during the testing of the device are stored in a memory in the device. In this way, the test results are connected with the device and available at any time for later evaluations.

REFERENCES:
patent: 5289113 (1994-02-01), Meaney et al.
patent: 6115828 (2000-09-01), Tsutsumi et al.
patent: 6130442 (2000-10-01), Di Zenzo et al.
patent: 6256756 (2001-07-01), Faulk, Jr.
patent: 6330693 (2001-12-01), Lindsay
patent: 6467054 (2002-10-01), Lenny
patent: 6477672 (2002-11-01), Satoh
patent: 6622269 (2003-09-01), Ngo et al.
patent: 6651202 (2003-11-01), Phan
patent: 197 23 262 (1998-04-01), None

Affiliated with

Also associated with

Rating

Method for testing a device and a test configuration... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing a device and a test configuration..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing a device and a test configuration... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3432381