Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-31
2006-10-31
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07129735
ABSTRACT:
A method for test data-driven detection of outlier semiconductor devices. Some illustrative embodiments may be a method used to test a semiconductor die comprising performing a burn-in test of a plurality of sample semiconductor dies to identify a failure of a defective semiconductor die, correlating variations in a parameter with the failure (the parameter comprising a characteristic associated with the plurality of sample semiconductor dies), defining a parameter constraint associated with the parameter, performing a production test of a production semiconductor die, and identifying the production semiconductor die as an outlier semiconductor die (the outlier semiconductor die passing the production test, but failing to conform to the parameter constraint).
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Butler Kenneth M.
Carulli John M.
Lawrence Richard A.
Subramaniam Suresh
Nguyen Ha Tran
Nguyen Tung X.
Stewart Alan K.
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