4. Optical: systems and elements
  5. Deflection using a moving element
  6. Using a periodically moving element

Suresh Subramaniam

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Identification of outlier semiconductor devices using...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method for establishing connections by allocating links and...

Optical: systems and elements – Deflection using a moving element – Using a periodically moving element
Reexamination Certificate

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Method for test data-driven statistical detection of outlier...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2579983

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