Method for test case generation

Details Method for test case generation Method for test case generation

2011-01-04

2011-01-04

Le, Dieu-Minh (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S039000

Reexamination Certificate

active

07865780

ABSTRACT:
A system and method for providing randomly-generated test cases for a set of interfaces of a piece of software are disclosed. A test case generator is initialized with parameter arrays Spwith cardinality mpand a prime number qp. For each independent parameter p of each of the set of interfaces, a test case number t is generated. A test case is then generated based on the values for each independent parameter p and based on t and Sp, mp, and qp.

REFERENCES:
patent: 5542043 (1996-07-01), Cohen et al.
patent: 5913023 (1999-06-01), Szermer
patent: 6889199 (2005-05-01), Ramsey
patent: 2003/0023396 (2003-01-01), Boehm
patent: 2006/0101397 (2006-05-01), Mercer et al.
patent: 2006/0179351 (2006-08-01), Nathan et al.

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