Method for surfaced-passivated zinc-oxide

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Reexamination Certificate

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C438S172000, C438S216000, C438S261000, C438S421000, C438S591000, C438S595000, C257SE29246

Reexamination Certificate

active

07745272

ABSTRACT:
A semiconductor device has a heterostructure including a first layer of semiconductor oxide material. A second layer of semiconductor oxide material is formed on the first layer of semiconductor oxide material such that a two dimensional electron gas builds up at an interface between the first and second materials. A passivation layer on the outer surface stabilizes the structure. The device also has a source contact and a drain contact.

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Oliver Schmidt, Peter Kiesel, Chris G. Van de Walle, Noble M. Johnson, Jeff Nause and Gottfried H. Döhler, “Evidence for an electrically conducting layer at the native zinc oxide surface,” Jpn. J. Appl. Phys. Part 1, vol. 44, 7271-7274 (2005) (published Oct. 11, 2005).
Oliver Schmidt, Arnd Geis, Peter Kiesel, Chris G. Van de Walle, Noble M. Johnson, Andrey Bakin, Andreas Waag and Gottfried H. Döhler, “Analysis of a Conducting Channel at the Native Zinc Oxide Surface,” Superlattices and Microstructures, 39 (2006) 8-16.
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