Method for selectively covering a micro machined surface

Etching a substrate: processes – Etching of semiconductor material to produce an article...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C216S041000, C216S047000, C216S024000, C430S313000, C438S706000, C438S710000

Reexamination Certificate

active

10527670

ABSTRACT:
On a die that has etchings on a surface, firstly a sheet of negative photoresist is laid down which, by means of an exposure and subsequent development, is left only above the etchings; then, upon the negative photoresist, a positive photoresist is applied, which is subjected to exposure and development to produce functional geometries deposited in thin film; subsequently the positive photoresist is removed in a “lift-off” operation, and the negative photoresist is taken off in a plasma operation, thus revealing the etchings.

REFERENCES:
patent: 5091288 (1992-02-01), Zappella et al.
patent: 5888845 (1999-03-01), Bashir et al.
patent: 61 142761 (1986-06-01), None
patent: 62195146 (1987-08-01), None
patent: 10 168557 (1998-06-01), None
patent: WO 00/16105 (2000-03-01), None
Patent Abstracts of Japan, vol. 010, No. 340 (E-455), Nov. 18, 1986.
Patent Abstracts of Japan, vol. 1998, No. 11, Sep. 30, 1998.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for selectively covering a micro machined surface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for selectively covering a micro machined surface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for selectively covering a micro machined surface will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3863349

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.