Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-03-06
2007-03-06
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10957848
ABSTRACT:
In one embodiment, a method for selecting transistor threshold voltages on an integrated circuit may include assigning a first threshold voltage to selected groups of transistors such as cell instances, for example, and determining which of the selected groups of transistors to assign a second threshold voltage, that is lower than the first threshold voltage, by iteratively performing a cost/benefit analysis. The method may further include determining which of the selected groups of transistors having a third threshold voltage to assign the first threshold voltage by iteratively performing a cost/benefit analysis. The cost/benefit analysis may include calculating a cost/benefit ratio for each group of the selected groups of transistors. In addition, the cost/benefit analysis may include calculating an upcone benefit and a downcone benefit for groups of transistors coupled to one or more inputs and outputs, respectively.
REFERENCES:
patent: 6090153 (2000-07-01), Chen et al.
patent: 6111427 (2000-08-01), Fujii et al.
patent: 6427226 (2002-07-01), Mallick et al.
patent: 6487701 (2002-11-01), Dean et al.
patent: 6981231 (2005-12-01), Xie et al.
patent: 2002/0002701 (2002-01-01), Usami et al.
patent: 2003/0163792 (2003-08-01), Xie et al.
patent: 2004/0060024 (2004-03-01), Bednar et al.
patent: 2004/0128631 (2004-07-01), Ditzel et al.
patent: 2004/0230924 (2004-11-01), Williams et al.
patent: 2004/0243958 (2004-12-01), Bednar et al.
patent: 2005/0060676 (2005-03-01), Matsumura et al.
patent: 2005/0097494 (2005-05-01), Kitahara et al.
patent: 2005/0138588 (2005-06-01), Frenkil
David Nguyen, et al. “Minimization of Dynamic and Static Power Through Joint Assignment of Threshold Voltages and Sizing Optimization”; ISLPED '03; Aug. 25-27, 2003; pp. 158-163; Copyright 2003 ACM 1-58113-682-X/03/0008.
Evers Marius
Halbutogullari Alper
Trull Jeffrey E.
Williams Robert W.
Advanced Micro Devices , Inc.
Curran Stephen J.
Kivlin B. Noäl
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Whitmore Stacy A
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