Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-16
2006-05-16
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07047515
ABSTRACT:
A method places bypass capacitors for controlling the signal integrity of a signal routed between devices on a multi-layer printed circuit board by analysis of the routing of the signal and the signal characteristics. In general, when an interconnecting signal between devices is routed adjacent to an impedance control plane that does not serve as the circuit supply voltage plane or the reference voltage plane for all devices interconnected by the signal trace, the method selects locations for addition of bypass capacitors based upon the routing of the interconnecting signal trace to improve signal integrity.
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Bhandari Nitin
Vitek Clark A.
Extreme Networks
Fenwick & West LLP
Siek Vuthe
LandOfFree
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