Method for replacing defective memory cells in data...

Details Method for replacing defective memory cells in data... Method for replacing defective memory cells in data...

2006-06-20

2006-06-20

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S710000, C365S200000

Reexamination Certificate

active

07065687

ABSTRACT:
A method for replacing defective memory cells of a random access memory device of a data processing apparatus, in which, during the operation of the data processing apparatus, a defective memory cell is replaced by a replacement memory cell in the random access memory device by using a control instruction.

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patent: 5659551 (1997-08-01), Huott et al.
patent: 5706231 (1998-01-01), Kokubo
patent: 5758056 (1998-05-01), Barr

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