Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Reexamination Certificate
2008-01-22
2008-01-22
Wilczewski, M. (Department: 2822)
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
C438S906000, C438S003000
Reexamination Certificate
active
07320942
ABSTRACT:
A method for removal of metallic residue from a substrate after a plasma etch process in a semiconductor substrate processing system by cleaning the substrate in a hydrogen fluoride solution.
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Chen Xiaoyi
Ding Guowen
Kerns Ralph C.
Kumar Ajay
Nallan Padmapani C.
Applied Materials Inc.
Moser IP Law Group
Wilczewski M.
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