Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2005-01-18
2005-01-18
Lee, Eddie (Department: 2811)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S149000
Reexamination Certificate
active
06844222
ABSTRACT:
The present invention relates to reduce contact impedance of a gate electrode of a thin film transistor (TFT). It employs a double layer of AlNd/Cr or AlNd/Cr silicide as a material of the gate electrode and employs plasma atmosphere to clean a contact surface of the gate electrode.
Chiun-Hung Chen
Yu-Chou Lee
Chungwha Picture Tubes, Ltd.
Lee Eddie
Owens Douglas W.
Perkins Coie LLP
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