Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-01-18
2011-01-18
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C382S141000, C382S144000
Reexamination Certificate
active
07873936
ABSTRACT:
A method and system for quantifying manufacturing complexity of electrical designs randomly places simulated defects on image data representing electrical wiring design. The number of distinct features in the image data without the simulated defects and the number of distinct features in the image data with the simulated defects are determined and the differences between the two obtained. The difference number is used as an indication of shorting potential or probability that shorts in the wiring may occur in the electrical wiring design. The simulating of the defects in the image data may be repeated and the difference value from each simulation or run may be used to obtain a statistical average or representative shorting potential or probability for the design.
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Cranmer Michael S.
Surprenant Richard P.
International Business Machines - Corporation
MacKinnon, Esq. Ian D.
Rossoshek Helen
Scully , Scott, Murphy & Presser, P.C.
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