Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2006-10-02
2010-06-08
Baker, Stephen M (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
Reexamination Certificate
active
07734988
ABSTRACT:
A method for puncturing a Low Density Parity Check (LDPC). The method includes a) setting a codeword length and the total number of bit nodes to be punctured; b) selecting a check node (or check nodes) with highest priority excluding check nodes completely checked in a current round; c) selecting a bit node (or bit nodes) with a highest priority excluding bit nodes completely checked among bit nodes connected to the selected check node (or check nodes); d) determining whether the selected bit node is a bit node to be punctured, that is, it is not systematic, not set by a puncturing prohibition flag; e) puncturing an associated bit node if the selected bit node is the bit node to be punctured, setting unpunctured bit nodes connected to the selected check node by a puncturing prohibition flag, decreasing the number of remained bit nodes to be punctured by 1 and increasing the number of connected punctured node of associated check node by 1; f) determining whether the number of remaining bits to be punctured is greater than 0; and g) returning to step b) if the number of remaining bits to be punctured is greater than 0, and ending a puncturing process if the number of remaining bits to be punctured is not greater than 0.
REFERENCES:
patent: 7222284 (2007-05-01), Stolpman
patent: 7395494 (2008-07-01), Lee et al.
patent: 7519895 (2009-04-01), Kyung et al.
patent: 1653629 (2006-05-01), None
patent: 102005006366 (2005-06-01), None
Jaewon Kang et al., “Puncturing Method of LDPC Code Based on Girth Distribution” 2004.
Cho Myeon-Gyun
Kang Jae-Won
Kim Dong-Ho
Kim Kwang-Soon
Kim Yung-Soo
Baker Stephen M
Samsung Electronics Co,. Ltd
The Farrell Law Firm, LLP
Yonsei University
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