Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-26
2007-06-26
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10904226
ABSTRACT:
A method for providing memory cells that allow multiple variations of metal level assignments for bitlines and wordlines is disclosed. A memory cell includes two cell elements. The first and second cell elements are identically processed up to a metal-1 layer. The first cell element is subsequently processed with bitlines on a metal-2 layer and wordlines on a metal-3 layer. Next, the second cell element is processed with bitlines on the metal-3 layer and wordlines on the metal-2 layer.
REFERENCES:
patent: 6950355 (2005-09-01), Battacharya et al.
Moldovan Adam G.
Oppold Jeffery H.
Pai Neelesh Govindaraya
Dillon & Yudell LLP
LeStrange Michael J.
Siek Vuthe
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