Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2005-12-27
2008-08-19
Berman, Jack I. (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S50400H, C250S3960ML, C250S492100, C355S030000, C318S119000
Reexamination Certificate
active
07414251
ABSTRACT:
A method for providing an operable filter system for filtering particles out of a beam of radiation in lithography is disclosed. The method includes providing a slack foil or wire for intercepting the particles, mounting at least a first point or side of the foil or wire to a first position of a mounting assembly, and substantially stretching the slack foil or wire at least within the beam of radiation, substantially parallel to a direction in which the radiation propagates.
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ASML Netherlands B.V.
Berman Jack I.
Maskell Michael
Pillsbury Winthrop Shaw & Pittman LLP
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