Method for protecting the gate of a transistor and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

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C438S279000, C257SE21661, C430S394000

Reexamination Certificate

active

07838407

ABSTRACT:
A gate of a transistor in an integrated circuit is protected against the production of an interconnection terminal for a source/drain region. The transistor includes a substrate, at least one active zone formed in the substrate, at least one insulating zone formed in the substrate and a gate, the gate being formed above an active zone. A dielectric layer is formed on the transistor, the dielectric layer covering the gate. The dielectric layer is then etched while leaving it remaining at least on the gate so that the gate is electrically insulated from other elements formed above the dielectric layer. This etching is preferably carried out using a mask which was used for fabricating the gate and a mask which was used for fabricating the insulating zone.

REFERENCES:
patent: 5384287 (1995-01-01), Fukase et al.
patent: 5710073 (1998-01-01), Jeng et al.
patent: 6689655 (2004-02-01), Coronel et al.
patent: 6833575 (2004-12-01), Parekh et al.
patent: 2003/0130439 (2003-07-01), Clough et al.
patent: 2004/0067629 (2004-04-01), Beaman
patent: 2005/0032314 (2005-02-01), Parekh et al.
Preliminary French Search Report, FR 05 08835, dated Jun. 1, 2006.

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