Static information storage and retrieval – Read/write circuit – Testing
Patent
1995-01-31
1997-02-04
Dinh, Son
Static information storage and retrieval
Read/write circuit
Testing
371 211, G11C 700
Patent
active
056006004
ABSTRACT:
A method for testing an electrically programmable non-volatile memory including a cell matrix and an internal state machine which governs the succession and timing of the memory programming phases includes excluding the internal state machine, modifying at least one of the control signals to program the cell matrix, and verifying programming correctness.
REFERENCES:
patent: 4951254 (1990-08-01), Hans Ontrop et al.
patent: 4970727 (1990-11-01), Yoshikazu et al.
patent: 5224070 (1993-06-01), Iandrich et al.
patent: 5321699 (1994-06-01), Endoh et al.
Maccarrone Marco
Olivo Marco
Dinh Son
Driscoll David M.
Morris James H.
SGS--Thomson Microelectronics S.r.l.
LandOfFree
Method for programming and testing a nonvolatile memory does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for programming and testing a nonvolatile memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for programming and testing a nonvolatile memory will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-685955