Method for programming and testing a nonvolatile memory

Static information storage and retrieval – Read/write circuit – Testing

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371 211, G11C 700

Patent

active

056006004

ABSTRACT:
A method for testing an electrically programmable non-volatile memory including a cell matrix and an internal state machine which governs the succession and timing of the memory programming phases includes excluding the internal state machine, modifying at least one of the control signals to program the cell matrix, and verifying programming correctness.

REFERENCES:
patent: 4951254 (1990-08-01), Hans Ontrop et al.
patent: 4970727 (1990-11-01), Yoshikazu et al.
patent: 5224070 (1993-06-01), Iandrich et al.
patent: 5321699 (1994-06-01), Endoh et al.

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