Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate
Reexamination Certificate
2007-09-27
2009-10-13
Ngo, Ngan (Department: 2893)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having schottky gate
C438S167000, C257SE21086
Reexamination Certificate
active
07601573
ABSTRACT:
A nitride semiconductor device, which includes a III-V Group nitride semiconductor layer being composed of a III Group element consisting of at least one of a group containing of gallium, aluminum, boron and indium and V Group element consisting of at least nitrogen among a group consisting of nitrogen, phosphorus and arsenic, including a first nitride semiconductor layer including the III-V Group nitride semiconductor layer being deposited on a substrate, a second nitride semiconductor layer including the III-V Group nitride semiconductor layer being deposited on the first nitride semiconductor and not containing aluminum and a control electrode making Schottky contact with the second nitride semiconductor layer wherein the second nitride semiconductor layer includes a film whose film forming temperature is lower than the first nitride semiconductor layer.
REFERENCES:
patent: 6376860 (2002-04-01), Mitanaga et al.
patent: 6492669 (2002-12-01), Nakayama et al.
patent: 2001/0035530 (2001-11-01), Udagawa
patent: 2003/0064538 (2003-04-01), Fujimoto
patent: 2003/0082860 (2003-05-01), Yoshida et al.
patent: 2004/0155260 (2004-08-01), Kuzmik
patent: 2005/0285141 (2005-12-01), Piner et al.
patent: 10-335637 (1998-12-01), None
Y. Ohno, et al.; “International Conference on Nitride Semiconductor, Nara, 2003, Tu-P2. 067” (p. 375).
Y. Liu, et al.; Growth and characterization of high-quality quaternary AlInGaN epilayers on sapphire;Journal of Crystal Growth259 (2003), pp. 151-157.
Lee, et al.; “Characterization of GaN Schottky barrier photodetectors with a low-temperature GaN cap layer”; Journal of Applied Physics., vol. 94, No. 3, Aug. 1, 2003.
Antonelli, Terry Stout & Kraus, LLP.
New Japan Radio Co. Ltd.
Ngo Ngan
LandOfFree
Method for producing nitride semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for producing nitride semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for producing nitride semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4069081